Abstract

An ion optical analysis of a static mass analyzer, based on a second-order focusing magnetic mirror, was conducted while accounting for aberrations caused by the movement of ions outside the mean plane of the mass analyzer. As part of this study, an optimization algorithm was developed for the four-dimensional acceptance of the mass analyzer at a fixed resolution, formulated within the framework of the inverse problem.

中文翻译：

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基于磁镜的质量分析仪

 抽象

基于二阶聚焦磁镜对静态质量分析仪进行离子光学分析，同时考虑离子在质量分析仪平均平面外移动引起的像差。作为本研究的一部分，在逆问题框架内开发了一种优化算法，用于在固定分辨率下对质量分析仪进行四维接受。